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AFM Probes |
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Today AFM is one of the most powerful machines in Wafer, Hard Disk Media and LCD Industry in measuring surface texture. Our company provides different types and most latest and advances AFM Probes in the industry today to our customers. We also provide probes needed by our customers for their specific application.
AFM and SPM machine are powerful tools for the study and measurement of surface texture, molecular structure, defects |
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etc like those of semiconductor devices, HDD media, LCD panels and biological materials. Having the right probes can bring out the full potential of your AFMs and SPM machine.
We are the distributor of Applied Nanostructures, Inc ; a leader manufacturer of AFM and SPM probes for standard, advanced and customised applications. We have a wide of probes that meet your expectation in performance, cost and convenience. Please contact us at gsg@gsg-ultra.com for more information about our probes. |
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| Specialty Probes |
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FCL Series
FCL Series consists of tip less force calibration probes with five cantilevers. These probes are designed for the spring constant calibration of SPM probes.
- Length (μm): 52 - 442
- Spring Constant (N/m): 0.12 - 77
- Frequency (kHz): 14 - 1000
TAP-TALL
TAP-TALA |
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| Tapping/Non Contact Mode |
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ACL Series
Our ACL probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a long, thin cantilever that allows for greater laser clearance than our standard ACT model.
- Length (μm): 225
- Spring Constant (N/m): 45
- Frequency (kHz): 190
ACT Series
Our ACT probes are fabricated from highly doped, monolithic silicon, and are designed for tapping / non-contact mode applications. These probes feature a short cantilever.
- Length (μm): 125
- Spring Constant (N/m): 40
- Frequency (kHz): 300
HYDRA4V-100N Series
Our HYDRA4V-100N Series represent a great starting point when uncertain about which mode is appropriate for a given sample type. The medium spring constant and length provides an ideal balance between non-contact and contact mode applications, with the option to easily transition between the two modes.
- Length (μm): 100
- Spring Constant (N/m): 0.088
- Frequency (kHz): 42 |
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| Contact Mode |
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SHOCON Series
SHOCON probes are fabricated from highly doped, monolithic silicon, and feature shorter cantilevers than our SICON Series. SHOCON probes are ideal for contact mode applications.
- Length (μm): 225
- Spring Constant (N/m): 0.1
- Frequency (kHz): 28
SICON Series
SICON probes are fabricated from highly doped, monolithic silicon, and feature longer cantilevers than the SHOCON Series. SICON probes are designed for contact mode applications.
- Length (μm): 450
- Spring Constant (N/m): 0.2
- Frequency (kHz): 12
ANSCM-PC
ANSCM-PC probes are contact mode probes designed for Electronic Force Microscopy applications. These probes are coated on the reflex and tip sides with a thin layer of Pt-Ir, which allows for high resolution imaging.
- Length (μm): 450
- Spring Constant (N/m): 0.2
- Frequency (KHz): 12 |
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